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Solid State Technology Resource GuideCompany Profile CAMECA
Key Personnel: CEO:
George Antier Description: Provides metrology tools for the semiconductor industry and scientific instruments for micro-analysis based on SIMS, EPMA, LEXES and Atom Probe techniques. Flagships product Shallow Probe SP-300 is a high throughput fab metrology tool addressing all issues of accurate element quantitation in thin films. Full wafer mapping. Dopant, implant, deposited films. Product CategoriesThis company appears in the following product categories: |
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