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Solid State Technology Resource GuideCompany Profile Technos International Inc
Description: Provides analytical x-ray metrology tools and solutions for the semiconductor. Offers tools to measure trace metal contamination on the front and backside of wafers and tools to measure thin-film thickness, density surface, roughness, and composition. TXRF, VPD, XRF, XRR. Also offers metrology tools dedicated to the photovoltaics industry. Product CategoriesThis company appears in the following product categories: |
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