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Solid State Technology Resource GuideCompany Profile Jordan Valley Semiconductors Inc
Description: Manufactures x-ray based thin-film metrology systems, which provide nondestructive simultaneous measurements of film thickness, density, and surface or interface roughness. The combined innovative x-ray technologies enable small spot, high throughput, production measurements on thick or thin, opaque or transparent, single- or multilayer films. Product CategoriesThis company appears in the following product categories: |
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