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Solid State Technology Resource GuideCompany Profile JA Woollam Co Inc
Key Personnel: Apps Engr:
James Hilfiker Description: Offers a range of spectroscopic ellipsometers for nondestructive materials characterization, including thin-film thickness (single- and multilayer), optical constants, composition, growth/etch rates, and more. Instruments available for research and manufacturing metrology covering spectral ranges from vacuum UV to far-IR. Offering table-top, in-line, and in situ models. Product CategoriesThis company appears in the following product categories: |
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