Key Personnel: Pres: John M. Fleischer, Tech Dir: Jeffrey L. Guttman, Sls/Mktg Mgr: Allen M. Cary

Description: Manufactures beam profilers that measure light sources, such as lasers, LDs, LEDs, and VCSELs on several parameters. NanoScan slit profilers provide fast, precise optical alignment with nanometer accuracy; direct measurement of focused lasers used in industrial applications is also possible. Manufactures far-field profilers for divergent sources and a variety of camera-based profilers.