Key Personnel: Pres: John A. Woollam

Description: Offers multilayer and multiconstituent materials analysis by spectroscopic ellipsometry, in-situ real-time data acquisition and analysis, as well as research-grade ex-situ variable angle spectroscopic ellipsometry (VASE). Both fully automated, computer-controlled, 190- to 1700-nm spectral range. Measures film thicknesses, optical constants, alloy fractions, and surface and interfacial roughness. Measurement services available.