Key Personnel: Oper Coord: James Norberg, Dir Sls/Mktg: Ray Caron

Description: Offers surface analysis, materials characterization and trace elemental analysis. Techniques include dynamic SIMS, TOF-SIMS, XPS/ESCA, Auger, SAM, Auger Defect Review, FTIR, GDMS, IGA, ICP-OES, LA-ICP-MS, TEM/STEM, SEM/EDS, FIB, TXRF, AFM/SPM, RBS, NRA, HFS, PIXE, Ion Channeling, micro Raman, GC/MS, Chip Decapsulation, FIB Circuit Edit, ESD and Latchup.